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KMID : 0385520080210050397
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Analytical Science & Technology
2008 Volume.21 No. 5 p.397 ~ p.402
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Determination of Trace Silicon in Uranium Dioxide by UV-VIS Spectrophometry
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Choi Kwang-Soon
Cho Kih-Soo
Han Sun-Ho
Song Kyu-Seok
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Abstract
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Uranium dioxide was dissolved with nitric acid and a trace amount of HF. The analytical conditions of a spectrophotometer were investigated to determine a trace amount of silicon in the uranium matrices without a separation process. The effects of a trace amount of HF on the determination of silicon were examined. Boric acid was used to eliminate HF the interference in the colorimetric process. The recovery of silicon in the presence of a trace amount of HF in uranium solutions with or without saturated boric acid was 103.3±0.8 and 76.6±6.8%, respectively. The amount of saturated boric acid did not affect the recovery of the silicon. Therefore it was possible for this procedure to measure a trace amount of silicon in a uranium matrix without a separation by a UV-VIS spectrophotometry.
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KEYWORD
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uranium dioxide, silicon, saturated boric acid, spectrophotometry
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